The physical properties of SnO₂ thin films deposited by rheotaxial growth and thermal oxidation method

Shatha Shammon Batros Jami

Physical Sciences Research International
Published: November 25 2014
Volume 2, Issue 3
Pages 62-67

Abstract

This research SnO₂ thin films was prepared by using rheotaxial growth and thermal oxidation (RGTO) method. The pure Sn powder was evaporate by using melbedume bot at vacuum 10^-6 torr on glass substrate till it reached its evaporate temperature. Thin films at thickness 3000°A were prepared, after that treated with 450°C and to obtain SnO₂ thin films in the presence of O₂. The X-ray Diffraction (XRD) results refer to polycrystalline phase Scanning Electron Microscopy (SEM), which studies the local morphology and the surface of SnO₂ thin films obtained by Rheotaxial Growth and thermal Oxidation (RGTO) method. SEM shows a fractal-like morphology of nanograins (22 nm typical size). The optical properties were studying by using uv-vis spectra and it was found that the transmittance was ~70%. The value of energy gap was 3.85 eV.

Keywords: RGTO thin films, thin dioxide thin film.

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